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Home > News > WEBINAR: Improving reliability of NAND storage using trace tools

WEBINAR: Improving reliability of NAND storage using trace tools

6 September 2022

DAVE Embedded Systems invites you to the webinar Improving reliability of NAND storage using trace tools, organized by Lauterbach and Western Digital.

You will learn:

  • The impact of wear-out on the life expectancy of NAND-based storage devices
  • How to set up microprocessor trace for a storage device with a minimum amount of, or even no code instrumentation at all
  • Estimate storage life time using captured microprocessor trace data

This seminar will illustrate how to perform workload analysis of managed NAND flash memory to assess application-specific memory aging and optimize the system for reliability and maximum lifetime. Who is this webinar for? It is intended for embedded software developers working on systems where reliability and lifetime are important
considerations.

The webinar is an interactive on-line seminar which you can watch in audio-video with your computer, connected to the internet. The presentation will be held in English and will include a live demonstration to showcase the logging and analysis techniques described.


Date and time:

Thursday September 29th, 2022

  • 1st session 9:00 AM CEST, lasting about 1 hour
  • 2nd session 5:00 PM CEST, lasting about 1 hour

Note: the webinar will be held twice at two different times, each participant can register for the first session, or the second or both.


Agenda:
  • Considerations using managed NAND devices
  • Logging memory accesses
  • Live Demo
  • Analysis of memory access
  • Comparison with software methods
  • Conclusion
  • Q&A

Organizers: Markus Herdin and Maurizio Menegotto from Lauterbach

Speakers: Rudi Dienstbeck and Marco Ferrario from Lauterbach, Matteo Zammattio from Western Digital.
 

Registration:

The seminar is free, to participate you need to register at one of these links:

>> Register for session 1 at 9:00 AM CEST

>> Register for session 2 at 5:00 PM CEST

>> READ MORE

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